Abstract:In the realm of diverse high-dimensional data, images play a significant role across various processes of manufacturing systems where efficient image anomaly detection has emerged as a core technology of utmost importance. However, when applied to textured defect images, conventional anomaly detection methods have limitations including non-negligible misidentification, low robustness, and excessive reliance on large-scale and structured datasets. This paper proposes a texture basis integrated smooth decomposition (TBSD) approach, which is targeted at efficient anomaly detection in textured images with smooth backgrounds and sparse anomalies. Mathematical formulation of quasi-periodicity and its theoretical properties are investi…
Abstract:In the realm of diverse high-dimensional data, images play a significant role across various processes of manufacturing systems where efficient image anomaly detection has emerged as a core technology of utmost importance. However, when applied to textured defect images, conventional anomaly detection methods have limitations including non-negligible misidentification, low robustness, and excessive reliance on large-scale and structured datasets. This paper proposes a texture basis integrated smooth decomposition (TBSD) approach, which is targeted at efficient anomaly detection in textured images with smooth backgrounds and sparse anomalies. Mathematical formulation of quasi-periodicity and its theoretical properties are investigated for image texture estimation. TBSD method consists of two principal processes: the first process learns the texture basis functions to effectively extract quasi-periodic texture patterns; the subsequent anomaly detection process utilizes that texture basis as prior knowledge to prevent texture misidentification and capture potential anomalies with high this http URL proposed method surpasses benchmarks with less misidentification, smaller training dataset requirement, and superior anomaly detection performance on both simulation and real-world datasets.
| Subjects: | Computer Vision and Pattern Recognition (cs.CV); Machine Learning (stat.ML) |
| Cite as: | arXiv:2512.20432 [cs.CV] |
| (or arXiv:2512.20432v1 [cs.CV] for this version) | |
| https://doi.org/10.48550/arXiv.2512.20432 arXiv-issued DOI via DataCite | |
| Related DOI: | https://doi.org/10.1080/24725854.2025.2606372 DOI(s) linking to related resources |
Submission history
From: Xiaowei Yue [view email] [v1] Tue, 23 Dec 2025 15:21:18 UTC (10,533 KB)