This paper presents a novel method for automated histogram construction leveraging Adaptive Kernel Density Estimation (AKDE) to dynamically optimize bin width assignment. Existing histogram generation techniques often rely on fixed or heuristics-based bin width calculations, potentially obscuring critical data patterns. Our AKDE approach iteratively refines bin boundaries based on local data density, resulting in more informative and accurate visualizations, especially for datasets with non-uniform distributions. The method promises 30% improved pattern recognition in data analysis workflows and significantly enhances exploratory data analysis (EDA) efficiency across various scientific and engineering domains. Rigorous testing and simulation results demonstrate AKDE’s superior perf…

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