A Fault Traceability Method for Accuracy Out-of-Tolerance in Linear Optical Encoders Based on Dempster-Shafer Evidence Theory and Fault Tree Analysis (opens in new tab)
Publication date: Available online 12 June 2026Source: Reliability Engineering & System SafetyAuthor(s): Chuanhai Chen, Guanyu Li, Tongtong Jin, Jinyan Guo, Zhifeng Liu
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