This research introduces a novel framework for automated anomaly detection in 4-point probe (4PP) measurements subjected to stress-induced resistance drift, a common challenge in characterizing thin-film semiconductors. Our method leverages Bayesian hyperparameter optimization (BHPO) to dynamically tune a recurrent neural network (RNN) classifier, enabling real-time identification of anomalous data points indicative of device degradation or measurement errors. Unlike traditional threshold-based approaches which lack adaptability, our system offers robust anomaly detection across varying stress conditions and device characteristics. The technology promises to significantly improve the accuracy and efficiency of materials characterization, potentially Revolutionizing the failure ana…

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