Abstract

This paper introduces a novel, multi-layered evaluation pipeline designed to rigorously assess and optimize Semiconductor Fabrication Process (SFP) parameters. Combining advanced semantic parsing, logical consistency verification, and reinforcement learning feedback, the pipeline achieves a 10x improvement in identifying critical process variations and forecasting their impact on chip yield. The approach leverages a hierarchical scoring mechanism with hyperparameter optimization to facilitate rapid experimentation and actionable insights for SFP engineering teams.

Introduction

The relentless pursuit of greater chip density and performance within the Semiconductor Fabrication Process (SFP) demands an increasingly sophisticated approach to process optimization. Tr…

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