Illustration of Our Approach for SSClassNotes. (a) In this case, Condition (2) is satisfied for class j, and testing can stop. (b) Here, Condition (2) is not satisfied; f(X) could be j or j + 1, so testing must continue. Credit: Operations Research (2025). DOI: 10.1287/opre.2023.0431

Diagnostic testing is big business. The global market for testing semiconductors for defects is estimated at $39 billion in 2025. For medical lab tests, the market is even bigger: $125 billion.

Both kinds of tests have something in common, says Rohan Ghuge, assistant professor of decision science in the information, risk, and operations management department at Texas McCombs. They involve complex systems with vast numbers of components, whether they’re evaluating computer chips or human bodies.

New research from Texas McCombs suggests a new approach to testing complex systems that might save time by eliminating some unnecessary and expensive steps. “Nonadaptive Stochastic Score Classification and Explainable Half-Space Evaluation” is published in Operations Research.

Currently, a common shortcut is to conduct sequences of tests. Instead of testing every component—which isn’t practical for complex systems—a clinician might test certain components first. Each round rules out some possible problems and sets up a new round of tests.

That approach has time-consuming drawbacks, Ghuge says. “First, you might check the vital signs. Then, you come back the next day and do an ECG [electrocardiogram], then we do blood work, step by step. That’s going to take a lot of time, which we don’t really want to waste for a patient.”

What if, he wondered, a single round of tests could provide the most critical information in a fraction of the time? What if the same protocol could prove useful for chips or in clinics?

“We want something that’s highly scalable, deployable, and uniform,” he says. “You need to have it in a way that can be deployed on thousands of kinds of chips, or a first step that you give to clinicians for every patient of that kind.”

Merging success and failure

The key, Ghuge theorized, was to choose a small number of tests that could quickly classify a system’s risk level: low, medium, or high. With Anupam Gupta of New York University and Viswanath Nagarajan of the University of Michigan, he set out to design such a protocol.

Their solution was to combine two sets of tests with opposite goals. One set diagnoses whether a system is working, while the other diagnoses whether it’s failing. Together, they can provide a snapshot of risk.

“You create two lists, say, a success list and a failure list,” Ghuge says. “You combine a fraction of the first list and a fraction of the second list. You want to come up with a single batch of tests that tell you at the same time whether the system is working or failing.”

An existing medical example, he says, is the HEART Score. It rates five factors, such as age and ECG results, to quickly assess the risk that a patient with chest pain will have a major cardiac event within six weeks.

In simulations, Ghuge tested his algorithm against a sequential one on the same sets of data. His got results over 100 times as fast as the sequential algorithm, at a cost that averaged 22% higher.

“The tests are a bit more costly,” he says. “The trade-off is that you can get them done a lot faster.”

But he also notes that a single batch of tests might reduce setup costs, he says, compared with the expenses of setting up one test after another.

A next step, Ghuge hopes, is to try out his algorithm on real-life testing. A broadband internet network, such as Google Fiber or Spectrum, might use it for daily testing, to rapidly diagnose whether a system or subsystem is working.

“I come from a more theoretical background that focuses on the right model,” he says. “There’s a gap between that and applying it in practice. I’m excited to speak with people, to talk to practitioners and see if these can be applied.”

More information: Rohan Ghuge et al, Nonadaptive Stochastic Score Classification and Explainable Half-Space Evaluation, Operations Research (2025). DOI: 10.1287/opre.2023.0431

Citation: New testing scheme could work for chips and clinics (2025, November 6) retrieved 6 November 2025 from https://techxplore.com/news/2025-11-scheme-chips-clinics.html

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