ScienceDirect Publication: Microelectronic Engineering rss.sciencedirect.com

Dependence of single-pulse avalanche ruggedness in μH inductor circuit on SiC MOSFETs structure

sciencedirect.com·1w

A product qualification vehicle (PQV) for accelerated yield learning and efficient fault isolation in 28 nm HKMG technologies by capturing LDE and BEOL weak pat...

sciencedirect.com·3w

Variability in HfO 2 -based memristors under pulse operation

sciencedirect.com·3w

Editorial Board

sciencedirect.com·3w

Variation-robust CMOS monostable multivibrator-based spiking neuron and spiking neural networks

sciencedirect.com·4w

Graphene nanoribbon interconnects for RF sensing: Modeling and performance analysis using ring oscillators

sciencedirect.com·5w

An electromagnetic study of scalability of Si₃N₄ optical waveguides for 3D nanophotonic integration with CMOS electronics in AI era

sciencedirect.com·6w

A new subthreshold half-select free SRAM with dynamic feedback cut-off for low-power and high speed applications

sciencedirect.com·6w

Resistive switching characteristics of ZnO/HfO₂ RRAM using TiN/Ti electrode with a graphene interlayer

sciencedirect.com·6w

Design and characterization of 2-GaN MIS-HEMT integrated cascode power module

sciencedirect.com·6w

Effect of thermally-induced cracks on the mechanical and electrical behaviour of TGVs

sciencedirect.com·6w

Comprehensive statistical analysis of random telegraph noise: Impact of gate voltage, temperature, and Bias time

sciencedirect.com·9w

Evaluation of the robustness of the defect-centric model for defect parameter extraction from RTN and BTI analysis using Comphy

sciencedirect.com·10w

A DC − 24 GHz SPDT switch design in 22 nm FD-SOI CMOS for 5G FR1 and FR3 bands

sciencedirect.com·11w

Asynchronous real-time learning in Spiking Neural Network using 3-terminal Resistance Random Access Memory

sciencedirect.com·11w

Editorial Board

sciencedirect.com·11w

Research on evaluation method of data retention capability of STT-MRAM chips

sciencedirect.com·11w

Asynchronous real-time learning in Spiking Neural Network using 3-terminal Resistance Random Access Memory

sciencedirect.com·11w

Understanding the impact of contacts and top gate scaling on the reliability of nanoscale MoS<math xmlns:mml="http://www.w3.org/1998/Math/MathML" altimg="si6.sv...

sciencedirect.com·13w

Vialess non-spiral on-chip stacked transformer on high-resistivity silicon for improved RF power transfer efficiency

sciencedirect.com·14w

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