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ScienceDirect Publication: Microelectronic Engineering
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Exploring the relationship between doping and Ti-silicidation for advanced FDSOI applications
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3d
3 days ago
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From dopant diffusion to optical functionality: A computational study of hyperdoped silicon
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6d
6 days ago
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Editorial Board
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1w
1 week ago
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Geometry modulated dual-mode memristor via grayscale thermal probe lithography
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3w
3 weeks ago
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AdaScale-HDNet: Adaptive scale lithography hotspot detection network based on SKConv and AFPN
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3w
3 weeks ago
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Layered rare-earth oxychloride YOCl as a scalable high-κ van der Waals dielectric
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5w
5 weeks ago
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PEALD-AlON passivated GaN-on-Si Millimeter-wave MIS-HEMTs with low noise and high linearity
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7w
7 weeks ago
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Editorial Board
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8w
8 weeks ago
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Reconfigurable ferroelectric GAAFET architectures for advanced logic circuits
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8w
8 weeks ago
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Readout scheme in analog computing-in-memory: Review of design principles and recent progress
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8w
8 weeks ago
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2 T DRAM characteristics applying a temperature-dependent a-IGZO TFT model
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8w
8 weeks ago
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Modelling the ON-state gate leakage current in p-GaN gated AlGaN/GaN HEMTs
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8w
8 weeks ago
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Soft detrap scheme for suppressing read-after-write-delay in 3D ferroelectric NAND arrays
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8w
8 weeks ago
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Overclocking-tolerant and all on-chip CIM processor for energy-efficient edge lightweight AI inference through custom SOT-MRAM and algorithm-circuit synergy
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8w
8 weeks ago
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Multi-threshold reservoir computing system for high-efficiency temporal signal processing
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12w
12 weeks ago
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A review of nanoimprint lithography for improving the optical performance of solar cells
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15w
15 weeks ago
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Tailoring Ga 2 O 3 for solar-blind UV photodetectors: A comprehensive review of materials, techniques, and applications
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16w
16 weeks ago
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Proposal of a compact plasmonic structure for implementing all-optical logic gates in the C-band
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16w
16 weeks ago
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Dependence of single-pulse avalanche ruggedness in μH inductor circuit on SiC MOSFETs structure
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19w
19 weeks ago
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A product qualification vehicle (PQV) for accelerated yield learning and efficient fault isolation in 28 nm HKMG technologies by capturing LDE and BEOL weak pat...
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20w
20 weeks ago
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